Subjects : High temperature characterization
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2018 | High Temperature Characterization and Analysis of GaN-on-Diamond FETs Hyung Seok Lee 한국 반도체 학술 대회 (KCS) 2018, pp.665-666 |
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| Type | Year | Research Project | Primary Investigator | Download |
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