Subjects : Multiple benchmark
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2024 | Enhancing Product Assurance and Reliability through a Machine Learning-Based Data Analysis System Kim Dohun IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE) 2024, pp.1-7 | 0 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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