Subjects : Threshold behavior
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2006 | Temperature, Current, and Voltage Dependences of Junction Failure in PIN Photodiodes Park Sahnggi ETRI Journal, v.28, no.5, pp.555-560 | 3 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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