Subjects : potential failures
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2025 | Investigation of Chlorine-Induced Damage in Oxide Semiconductor Transistors Na Jae Won ACS Applied Electronic Materials, v.7, no.13, pp.6128-6136 | 0 | 원문 |
| Journal | 2016 | CPS-based Fault-tolerance Method for Smart Factories Kang Sung Joo at - Automatisierungstechnik, v.64, no.9, pp.750-757 | 9 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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