Subjects : embedded test
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2012 | Evaluation of Seebeck coefficients in n- and p-type silicon nanowires fabricated by complementary metal–oxide–semiconductor technology Hyun Younghoon Nanotechnology, v.23, no.40, pp.1-7 | 13 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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