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Registered High-resolution optical microscope system using polarizer and fast Fourier transform method for a nanowire device
이미지 확대
High-resolution optical microscope system using polarizer and fast Fourier transform method for a nanowire device
- Inventors
- Kim Eunkyoung, Kang-Ho Park, Park Jonghyurk, Moon Seungeon, Lee Hongyeol, Kim Jongdae, 김규태, 박응석, 장도영, 지현진
- Application No.
- 07285276 (1995.11.01)
- Publication No.
- 09121679 (1997.05.13)
- Registration No.
- 4690379 (2011.02.25)
- Country
- JAPAN
- Project Code
- 06MB3100, Components/Module technology for Ubiquitous Terminals, Kim Jongdae
- Abstract
- (57)[要約][課題] 従来の菜果切断用指ハサミは切断刃の部分の摩耗が発生し、切れ味が低下するという不具合を解消すべく替刃方式の菜果切断用指ハサミを提供する。[解決手段] 人差指1に挿入し、野
- KSP Keywords
- Fast Fourier, Fast Fourier Transform(FFI), Fast Fourier transform method, Fourier Transform, Fourier transform method(FTM), High resolution, Optical Microscope, Transform method, nanowire device
- Family
| Status | Patent | Country | KIPRIS |
|---|---|---|---|
| Registered | 편광판과 고속 푸리에 변환을 이용한 나노선 감지용 광학 현미경 시스템 | KOREA | KIPRIS |