ETRI-Knowledge Sharing Plaform

ENGLISH

성과물

특허 검색
구분 출원국
출원년도 ~ 키워드

상세정보

등록 파장 자동 인식 장치 및 방법

파장 자동 인식 장치 및 방법
이미지 확대
발명자
문실구, 이은구, 이상수, 설동민, 정의석, 조정식, 이종현
출원번호
13538482 (2012.06.29)
공개번호
20130004165 (2013.01.03)
등록번호
9106335 (2015.08.11)
출원국
미국
협약과제
11PI2500, 차세대 응용플랫폼을 위한 대용량 WDM-PON시스템 개발, 이상수
초록
Provided are an automatic wavelength recognition apparatus and method. The automatic wavelength recognition apparatus includes: a division unit receiving a single optical signal and dividing the received optical signal into a plurality of optical signals; a plurality of filter units filtering the optical signals and having different and wavelength-dependent pass characteristics; a plurality of detection units detecting the filtered optical signals and measuring intensities of the detected optical signals; at least one comparison unit comparing outputs of any two of the detection units; and a wavelength determination unit receiving an output of the at least one comparison unit and determining a wavelength of the above single optical signal using a pre-stored look-up table.
KSP 제안 키워드
Optical signal, Wavelength-dependent, look-up table