ETRI-Knowledge Sharing Plaform

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성과물

특허 검색
구분 출원국
출원년도 ~ 키워드

상세정보

등록 광계층 감시장치 및 방법

광계층 감시장치 및 방법
이미지 확대
발명자
이한협, 명승일, 이상수, 정의석, 이종현
출원번호
13838309 (2013.03.15)
공개번호
20130294768 (2013.11.07)
등록번호
9136941 (2015.09.15)
출원국
미국
협약과제
11PI2500, 차세대 응용플랫폼을 위한 대용량 WDM-PON시스템 개발, 이상수
초록
An optical layer monitoring apparatus and method thereof are provided. According to an embodiment of the present invention, an optical layer monitoring apparatus including an optical time domain reflectometer (OTDR) function so as to monitor an optical path of a passive optical network (PON), and a method for improving accuracy of measured monitoring results using the optical layer monitoring apparatus are provided. Therefore, it is possible to enable a user to continuously detect distortion or attenuation along the optical path, and to quickly recover from the distortion or attenuation along the optical path when distortion or attenuation is detected.
KSP 제안 키워드
Improving accuracy, Optical layer, Optical network, Optical path, Optical time domain reflectometer(OTDR), Passive optical network, Passive optical network (pon), time-domain, time-domain reflectometer