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Detail
Registered Optical layer monitoring apparatus and method thereof
- Inventors
- Lee Han Hyub, Myong Seung Il, Lee Sang Soo, Jung Eui Suk, Lee Jong Hyun
- Application No.
- 13838309 (2013.03.15)
- Publication No.
- 20130294768 (2013.11.07)
- Registration No.
- 9136941 (2015.09.15)
- Country
- UNITED STATES
- Project Code
- 11PI2500, High-capacity WDM-PON system for next-generation multi-service applicable access platform, Lee Sang Soo
- Abstract
- An optical layer monitoring apparatus and method thereof are provided. According to an embodiment of the present invention, an optical layer monitoring apparatus including an optical time domain reflectometer (OTDR) function so as to monitor an optical path of a passive optical network (PON), and a method for improving accuracy of measured monitoring results using the optical layer monitoring apparatus are provided. Therefore, it is possible to enable a user to continuously detect distortion or attenuation along the optical path, and to quickly recover from the distortion or attenuation along the optical path when distortion or attenuation is detected.
- KSP Keywords
- Improving accuracy, Optical layer, Optical network, Optical path, Optical time domain reflectometer(OTDR), Passive optical network, Passive optical network (pon), time-domain, time-domain reflectometer