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Registered THERMAL CONDUCTIVITY MEASURING DEVICE AND METHOD OF MEASURING THE THERMAL CONDUCTIVITY

Inventors
Hyun Younghoon, Park Young Sam, Jang Moon Gyu, Taehyoung Zyung
Application No.
13780166 (2013.02.28)
Publication No.
20140010258 (2014.01.09)
Registration No.
9170223 (2015.10.27)
Country
UNITED STATES
Project Code
11ZE1100, A Creative Research on ETRI R&DB System and Seed Project for enhancing ETRI Capability, Jee Kyoung Yong
Abstract
The inventive concept relates to a thermal conductivity measuring device and a method of measuring the thermal conductivity. The thermal conductivity measuring device may include a first structure which is connected to one side end of a sample and receives heat from a heat source; a second structure connected to the other side end of the sample; a first stage connected to the first structure while supporting the first structure; a second stage connected to the second structure while supporting the second structure; a connection unit connected between the first stage and the second stage; and a measuring unit measuring temperatures of the first and second structures and the first and second stages. Since the thermal conductivity measuring of the inventive concept correct a temperature change of a stage due to heat transmission emitted from the stage considering a measurement environment, reliability of measurement may be improved.
KSP Keywords
First stage, Heat source, Heat transmission, Measuring unit, Temperature change, connection unit, inventive concept, measuring device, thermal conductivity
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Status Patent Country KIPRIS
Registered THERMAL CONDUCTIVITY MEARSURING DEVICE AND MEASURING METHOD THEREOF KOREA KIPRIS
Registered THERMAL CONDUCTIVITY MEASURING DEVICE UNITED STATES
Registered THERMAL CONDUCTIVITY MEASURING DEVICE AND METHOD OF MEASURING THE THERMAL CONDUCTIVITY UNITED STATES