Registered
METHOD AND APPARATUS FOR DETECTING ABNORMALITY OF MANUFACTURING FACILITY
- Inventors
-
Kang Hyun Chul, Eun Seo Lee, Park Ho Jin, Ji Yeon Son
- Application No.
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17136654 (2020.12.29)
- Publication No.
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20210240167 (2021.08.05)
- Registration No.
- 11709474 (2023.07.25)
- Country
- UNITED STATES
- Project Code
-
18PH3400, Manufacturing and Assembly as a Service (MAaS),
Ji Yeon Son
- Abstract
- A method and apparatus for detecting an abnormality of a manufacturing facility is disclosed. According to an example embodiment of the present disclosure, a learning model generating method for manufacturing facility abnormality detection may include receiving a measured value for a normal state of a manufacturing facility collected through a multi-sensor on a time-by-time basis, generating a learning model including a predetermined weight set and training the learning model using the measured value, and determining, using the learning model, a threshold corresponding to a boundary between the normal state and an abnormal state of the manufacturing facility and a criterion for determining the abnormal state in a local window representing a predetermined time interval.
- KSP Keywords
- Abnormal state, Abnormality detection, Generating method, Learning model, Multi-Sensor, Normal state, Time interval, local window