Registered
제품 결함을 검출하기 위한 비전 검사 장치 및 방법
- Inventors
-
한경수, 오천인, 김우진
- Application No.
- 2022-0020075 (2022.02.16)
- Publication No.
- 10-2023-0022784 (2023.02.16)
- Registration No.
- 2828774 (2025.06.30)
- Country
- KOREA
- Project Code
-
17HH5100, Vision Inspection System Based on Deep Learning Method ofr Semiconductor Post-processing Equipments,
Kyeong-Soo Han
- KSP Keywords
- Vision inspection