Registered
METHOD, SERVER,AND SYSTEM FOR DEEP METRIC LEARNING PER HIERARCHICAL STEPS OF MULTI-LABELS AND FEW-SHOT INFERENCE USING THE SAME
- Inventors
-
Hyunwoo Cho, Kim Jeong-Si
- Application No.
- 17/880229 (2022.08.03)
- Registration No.
- 12462155 (2025.11.04)
- Country
- UNITED STATES
- Project Code
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21HS1900, Development of Acceleration SW Platform Technology for On-device Intelligent Information Processing in Smart Devices,
Kim Jeong-Si
- KSP Keywords
- Deep Metric Learning, Metric learning, multi-label
- Family
-