ETRI-Knowledge Sharing Plaform

Mutation Testing Device Driver Open Source Computationally Expensive Concurrency Bugs Real-World New Approach Detection Techniques Cost Reduction Mutation Operators Detection Method Software System Empirical Study Multi-Core System Runtime Overhead Object Detection Embedded System Indoor Sensor Networks Domain Analysis Code Clone Detection Test Cases Thread Interleaving Test System Test Oracle Network System Negative Transfer Language Features Performance Improvement Model Architecture Random Noise Equivalent Mutants Automated Analysis Error Detection Rate Two-Stage Test Inputs Memory Access Adversarial Training Commercial Products Benchmark Suite Differential Testing Noise Injection Object-Oriented Programs Preliminary Evaluation Quantitative Data Patch-Wise Region Proposal Network Strong Mutation Testing Technique Testing Method Training Data State-Of-The-Art Adaptive Object Characteristic Study Cost-Effective Deep Learning(DL) Detection Performance Detection Domain Detection Capability Perceptual Distance Dl Model Long Time Language Model Weak Mutation Whole Process Testing Tool Reduction Method Reduction Effect System Support State Change Target Domain Transfer Effect Construction Materials Hidden Data Happens-Before Programming Language Real-Time Operating System Shared Memory Java Programs Source Code Generation Automated Test Art Performance Context Information Domain Adaptation Domain Information Data Race Loss Of Effectiveness Large Domain Radio Propagation Test Set Testing Device Mission-Critical Applications Multi-Scale Benchmark Datasets Class Level Dynamic Binding Efficient Testing Data Augmentation Noise Strength Image Classifier Loss Network Performance Comparison Reference Model Symmetric Multiprocessing Automated Tool Automated System Translation Model Test Case Generation Fine Details Facial Attributes Multi-Domain Combined Model Development Tools N-Version Hb Analysis Race Detection System Failure Sensor Network Simulator