ETRI-Knowledge Sharing Plaform

Mutation Testing Device Driver Open Source Cost Reduction Computationally Expensive New Approach Real-World Detection Techniques Concurrency Bugs Mutation Operators Detection Method Software System Code Clone Detection Empirical Study Runtime Overhead Object Detection Embedded System Indoor Sensor Networks Domain Analysis Test Cases Multi-Core System Language Features Network System Model Architecture Negative Transfer Performance Improvement Random Noise Test System Thread Interleaving Test Oracle Automated Analysis Adversarial Training Benchmark Suite Commercial Products Differential Testing Equivalent Mutants Error Detection Rate Memory Access Object-Oriented Programs Noise Injection Quantitative Data Preliminary Evaluation Region Proposal Network Strong Mutation Two-Stage Test Inputs Patch-Wise Adaptive Object Characteristic Study Cost-Effective Detection Capability Detection Performance Detection Domain Deep Learning(DL) Perceptual Distance State-Of-The-Art Testing Technique Testing Method Training Data Dl Model Language Model Long Time Reduction Method Reduction Effect System Support State Change Testing Tool Weak Mutation Whole Process Construction Materials Hidden Data Happens-Before Programming Language Real-Time Operating System Shared Memory Target Domain Transfer Effect Art Performance Automated Test Context Information Data Race Domain Adaptation Domain Information Large Domain Loss Of Effectiveness Radio Propagation Source Code Generation Java Programs Benchmark Datasets Class Level Dynamic Binding Data Augmentation Efficient Testing Image Classifier Loss Network Mission-Critical Applications Multi-Scale Noise Strength Reference Model Symmetric Multiprocessing Testing Device Test Set Performance Comparison Automated System Automated Tool Combined Model Development Tools Fine Details Facial Attributes Multi-Domain N-Version Race Detection Sensor Network Simulator System Failure Test Case Generation Translation Model Hb Analysis