ETRI-Knowledge Sharing Plaform

Mutation Testing Device Driver Cost Reduction Computationally Expensive New Approach Real-World Concurrency Bugs Open Source Detection Techniques Mutation Operators Detection Method Software System Code Clone Detection Empirical Study Runtime Overhead Object Detection Embedded System Domain Analysis Indoor Sensor Networks Test Cases Multi-Core System Language Features Model Architecture Network System Negative Transfer Test System Thread Interleaving Performance Improvement Random Noise Test Oracle Automated Analysis Adversarial Training Benchmark Suite Commercial Products Differential Testing Equivalent Mutants Memory Access Noise Injection Object-Oriented Programs Error Detection Rate Preliminary Evaluation Patch-Wise Quantitative Data Region Proposal Network Test Inputs Two-Stage Strong Mutation Adaptive Object Characteristic Study Cost-Effective Detection Capability Deep Learning(DL) Detection Performance Detection Domain State-Of-The-Art Testing Method Testing Technique Perceptual Distance Training Data Long Time Language Model Dl Model Weak Mutation Whole Process Testing Tool Reduction Method Reduction Effect System Support State Change Hidden Data Happens-Before Construction Materials Programming Language Real-Time Operating System Target Domain Transfer Effect Shared Memory Java Programs Loss Of Effectiveness Automated Test Art Performance Context Information Domain Adaptation Domain Information Data Race Large Domain Radio Propagation Source Code Generation Image Classifier Loss Network Benchmark Datasets Class Level Dynamic Binding Efficient Testing Data Augmentation Mission-Critical Applications Multi-Scale Noise Strength Test Set Testing Device Performance Comparison Reference Model Symmetric Multiprocessing Fine Details Facial Attributes Hb Analysis Automated System Automated Tool Combined Model Development Tools Multi-Domain N-Version Test Case Generation Race Detection Translation Model Sensor Network Simulator System Failure