ETRI-Knowledge Sharing Plaform

Edge Devices Deep Learning(DL) Smart Farm Limited Resources Internet Of Thing(IoT) Model Compression Computational Load Ionized Physical Vapor Deposition(IPVD) Oxide Tfts Memory Space Vapor Deposition Method Computing Power Backbone Network Cloud Of Things Data Production Environment Data Efficient Approximation Features Analysis High Accuracy Iot Environment Model Inference Application Authoring Convolution Neural Network(CNN) Closed-Form Solution Computation Time Efficient Design Gate Bias Stress Private Data Saturation Mobility Learning Model Spatial Information Advanced Techniques Defined Neural Network Electronic Materials Heterogeneous Devices Input Data Runtime Management Staggered Structure Oxide Thin Films Threshold Voltage(Vth) Fault Tolerance User Demand Amorphous Oxide And Gate Actor Model Computation Load CIFAR-10 Convolutional Networks Node Monitoring End-Users Glass Substrate Memory Consumption Network Load Oxide Thin-Film Transistors Computing Time Data Analysis Positive And Negative Learning Algorithms Scaling Factor Active Layer Analysis Framework Convolutional Filters Distributed Stream Processing Error Rate Instability Phenomena Idle Resources Low Rank Representation Mobile Edge Single-Input Distributed Environment Data Samples Field-Induced Highly Stable Indium Tin Oxide(ITO) Knowledge Distillation Stress Conditions Model Simplification Neural Network Model Transparent Electronics Chemical Strengthening Drain Bias Stress Igzo Tfts Improved Method Real-Time Environment Stable Characteristics