ETRI-Knowledge Sharing Plaform

X-Ray Sources Electron Beam Digital X-Ray Carbon Nanotube Paste E-Beam Cnt Paste Supporting Layer Triode Structure X-Ray Tube Surface Charging Field Electron Emission(FE) Focal Spot X-Ray Images Paste Emitters Temperature-Dependent Beam Characteristics Electron Transport Image Quality Optical Simulation Monte-Carlo Simulation(MCS) Electrical Conductivity Image Acquisition Mean Square Error(MSE) Screen-Printed Basic Research Cathode Substrate Adhesive Layer Test Device Annealing Conditions External Field Object Detection Si Layer Silicide Phase Turn-On Voltage In-Line X-Ray Imaging Trajectory Simulation Tube Voltage Layer-By-Layer(LbL) Simulation Framework X-Ray Inspection Tube Current Ground Truth Conductivity Measurement Multi-Source Ultraviolet Photoelectron Spectroscopy Carbon Nanotube Yarn Field Emitter Nanometer-Scale Spot Shape Conveyor System Insulating Materials Operation Mode Unit Test Ambient Temperature Image Contrast Temperature Dependency Electron Source Potential Barrier Conveyor Belt Imaging System Close Proximity Imaging Method Current-Voltage Measurements Simulation Study Acquisition Time High Performance Charging Model Ceramic Material Electrical Properties Finite-Element Analysis(FEA) Imaging Geometry Subsurface Imaging X-Ray Backscatter Disruptive Innovation Imaging Speed Field Operation Aspect Ratio Dot Arrays Kovar Alloy Medical Applications Soil Density Computational Performance Form Factor Work Function Human Remains High Resolution Silicon Carbide(3C-SiC) Diffusion-Limited Long-Term Durability Rotation Angle Trajectory Prediction Buried Objects Photon Count Soil Conditions Long Time Field Distribution Humanitarian Demining Simulation And Optimization Stacked Graphene Source Parameters Shape Characteristics Electron Emission Characteristics Ray Energy Inspection System 3d X-Ray Electron Bombardment Accurate Prediction Beam Tilting Field Emission Characteristics Nano Sic Stacking Methods Internal Object X-Ray Photoelectron Spectroscopy Ni Silicide Penetration Depth Field Emission Current Monte Carlo Method(MCNP) Computing Technology Nickel Nanoparticles Computational Simulation X-Ray Diffraction High Throughput Fe-Ni-Co(Nano WC-) Charged Particle Conventional Model Micro-Lens Detection Limit Root-Mean-Square(RMS) Signal Attenuation Spot Size Ct Imaging