ETRI-Knowledge Sharing Plaform

High Performance Spatial Light Modulator(SLM) Oxide Tfts Digital Holography Channel Length Organic Photodiode STRETCHABLE ELECTRONICS Digital Hologram High Field-Effect Mobility Data Line Indium Tin Oxide(ITO) Specific Detectivity Low Noise Holographic Display Gate Insulator Electrical Characteristics Molybdenum Oxide Liquid Precursor Indium Oxide Optical Components Near-Infrared(NIR) Complementary Metal-Oxide-Semiconductor(CMOS) Oxygen Vacancies Gate Line All-Oxide Three Dimensional(3D) Subthreshold Slope(SS) Pixel Structure Oxide Thin Films Oxide Channel Mixed Oxides Absorption Features Phase Change Material(PCM) Photoactive Layer Diethyl Zinc Adhesion Properties Back-Channel Etch Cathode Ray Tube Charge Transfer Conductive Paths Dry Etching Excellent Performance Electron States High Density Integration Holography System High-Speed Interface Low-Power Lossy Dielectric Layer Light Intensity Large Size Naked Eye Quantum Dot(QD) Sputtering Process 460 Nm Absorption Profile Cycle Ratio Continuous Operation Deposition Process Damp Heat Test Device Architecture Deformable Interconnects Electrical Performance Full-Color High Definition High-Quality Low Temperature(LT) Light Waves Next-Generation Non-Volatile Memory(NVM) Oxide Field Precursor Solution Reflection-Type Synergetic Contribution Transfer Characteristics Tft Array Transfer Process X-Ray Photoelectron Spectroscopy Ultra-High Resolution Trade-Off Charge Storage Critical Coupling Double-Gate(DG) Erasing And Rewriting Emotional Experience Electronic Product Electrical Contact Field-Effect Transistors(FETs) Fabrication Process Film Thickness High Responsivity Large-Area Electronics Mixing Ratio Numerical Simulations Noise Equivalent Power Quantitative Description Oxygen Plasma Oxygen-Deficient Pixel Integration Perfect Absorption P-Type Characteristics Single-Sided Spectral Asymmetry Subthreshold Swing(SS) Semiconductor Memory Small Molecular Temporal Response Top Illumination Weak Light Voltage Drop Ultrathin Layer 3d Object Thin-Film Phototransistors(TFPT) 10-Phenanthroline(BCP) Ald Process Ald Method Broadband Applications Cross Talk Connection System Device Fabrication Functional Additive Glass Substrate Hall Mobility Integrated Electronics Key Components Memory Structure Metal Oxide Thin-Film Transistors Novel Material Organic Transistor Pixel Array Rapid Development Self-Assembling Stretchable Substrate 3d Image Top-Illuminated Bottom Gate Color-Selective Channel Layer Display System Device Properties Device Performance Display Panel Dual-Functional End Functionality Energy-Efficient Frequency Range Gate Bias Integration Density Image Data Multi-Band Metal Surface Plasma-Enhanced Atomic Layer Deposition Persistent Photoconductivity Performance Degradation Plasma-Enhanced Ald Power Integrated Circuits Real-World Superior Performance Thin-Film Photodiode Trapped Electron(TE) Visible Range Zinc Oxide(ZnO) Cmos Inverter 20 Nm Amorphous Oxide Semiconductor Absorption Properties Binary Pattern Best Performance Computer Generated Holograms(CGH) Comparative Study Charge Extraction Etching Damage High External Quantum Efficiency High Mobility Hyper-Realistic Hole Mobility Integrated System Image Sensor Laser Writing Optical Simulation Subwavelength Metallic Gratings Spectral Absorption Wearable Device Tri-Layer Tin (Iv) Oxide Fingerprint Sensor Oxide Electronics Numerical Study 9-Dimethyl-4 Active Layer Thickness Active Matrix Channel Potential Channel Width Dark Current Highly Stable High Refractive Index High-Resolution Displays High Photoresponsivity Inorganic Semiconductors Image Hologram Very Large Scale Integration(VLSI) Liquid Crystal Mechanical Strain Proof Of Concept Photo-Generated Holes Structural Parameters Soft Electronics Stable Performance Two-Dimensional Image Vacuum Deposition Wide Viewing Angle Coupling Conditions Small Size 7-Diphenyl-1 Absorption Characteristic Bulk Heterojunction Current Injection Detection Band Film Formation High-Capacity K-Doped Low-Cost Linear Dynamic Range Large Display Manufacturing Processes Memristor Device Neuromorphic Hardware Operational Stability Resonant Cavity Simulation Results Solution-Processed Still Image Thin Structure Ultraviolet Laser 20th Century Performance And Reliability