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Field-Effect Transistors(FETs) Deep Traps Dynamic Characteristics Power Factor Correction (Pfc) Converter Creative Technology Commercial Products Silicon Carbide(3C-SiC) Low Temperature Cofired Ceramic(LTCC) Power Semiconductor Reverse Recovery Charge Electrical Resistance Low Current Performance Analysis Silicon Wafer Memory Device Surface Mount Low Voltage Power Module Power Losses Schottky Barrier Diode(SBD) Ultra-Thin Body(UTB) Surface Roughness Analysis Trap Sites Aluminum Wires Building Block Energy-Effective Energy Consumption Limiting Factors Multi-Layer Substrate Operating Speed Power Factor Correction Converter Silicon Epitaxial Layer System-On-Chip(SoC) Transit Time Thick Copper Theoretical And Experimental Analysis Sound Performance Amorphous Sio 2 Applied Bias Chemical Vapor Deposition Compact Model Density Change Hybrid Electronics Low Parasitic Inductance Reverse Voltage Silicon Electronics Snap-Back Build-Up Time Bulk Silicon Double-Pulse Diffraction Pattern Dynamic Test Human Brain Highly Crystalline Potential Barrier Parasitic Effects P-Type Rf Receiver Switching Device Sic Sbd Turn-Off Wide Range Optimized Process State Memory And Logic Gates Inductance Extraction Local Area Low Loss Memory-Based Pulse Width Pulse Number Pulse Generator Power Demand Silicon-On-Insulator (Soi) Technology Cross-Sectional Imaging High Voltage Heat Dissipation Key Parameters Level Shifter Long-Term Memory Multi-Level Storage Metal Oxide Semiconductor N-Type Transistors Power Density Pattern Analysis Process Conditions Reconfigurable Fet Stray Inductance Selective Epitaxial Growth(SEG) Trap Charges Time Effect Volatile Memory Uv Light Unique Characteristics Deposition Technique Artificial Intelligence Carrier Confinement Crystal Plane Human Memory Low Power Leakage Learning Mechanism Next-Generation Soi Process Epitaxial Lateral Overgrowth Novel Technique Electronic Devices Extraction Method Fabrication Process High Current Input Data Integrated Circuit Multi-State Multilayer Circuit Off-State Pulse Intervals Carrier Density Chemical Mechanical Polishing(CMP) Crystalline State Circuit Board Ltcc Substrate Model-Based Number Of Pulse Surface Potential