ETRI-Knowledge Sharing Plaform

Mutation Testing Device Driver New Approach Detection Techniques Computationally Expensive Real-World Concurrency Bugs Cost Reduction Open Source Mutation Operators Software System Code Clone Detection Empirical Study Detection Method Runtime Overhead Object Detection Embedded System Indoor Sensor Networks Domain Analysis Multi-Core System Test Cases Test System Thread Interleaving Test Oracle Language Features Model Architecture Negative Transfer Network System Performance Improvement Random Noise Adversarial Training Automated Analysis Two-Stage Commercial Products Object-Oriented Programs Benchmark Suite Test Inputs Differential Testing Equivalent Mutants Error Detection Rate Memory Access Noise Injection Patch-Wise Preliminary Evaluation Quantitative Data Region Proposal Network Strong Mutation Adaptive Object Testing Technique Testing Method Training Data Characteristic Study Cost-Effective Detection Performance Detection Domain Deep Learning(DL) Detection Capability Perceptual Distance State-Of-The-Art Weak Mutation Whole Process Testing Tool Dl Model Long Time Reduction Method Reduction Effect System Support State Change Target Domain Transfer Effect Construction Materials Hidden Data Happens-Before Programming Language Real-Time Operating System Shared Memory Art Performance Automated Test Java Programs Domain Information Context Information Domain Adaptation Data Race Large Domain Loss Of Effectiveness Radio Propagation Testing Device Test Set Benchmark Datasets Class Level Data Augmentation Dynamic Binding Efficient Testing Image Classifier Loss Network Multi-Scale Mission-Critical Applications Noise Strength Performance Comparison Reference Model Symmetric Multiprocessing Automated System Translation Model System Failure Combined Model Development Tools Fine Details Facial Attributes Hb Analysis Multi-Domain N-Version Race Detection Sensor Network Simulator Automated Tool Test Case Generation