ETRI-Knowledge Sharing Plaform

Mutation Testing Device Driver Open Source Cost Reduction Concurrency Bugs New Approach Real-World Detection Techniques Computationally Expensive Mutation Operators Detection Method Software System Code Clone Detection Empirical Study Runtime Overhead Object Detection Embedded System Indoor Sensor Networks Domain Analysis Test Cases Multi-Core System Test Oracle Thread Interleaving Test System Language Features Model Architecture Network System Negative Transfer Performance Improvement Random Noise Adversarial Training Automated Analysis Commercial Products Benchmark Suite Differential Testing Test Inputs Preliminary Evaluation Error Detection Rate Equivalent Mutants Memory Access Noise Injection Object-Oriented Programs Patch-Wise Quantitative Data Region Proposal Network Strong Mutation Two-Stage Adaptive Object Characteristic Study Cost-Effective Detection Domain Detection Capability Deep Learning(DL) Detection Performance Training Data Testing Technique Testing Method Perceptual Distance State-Of-The-Art Dl Model Testing Tool Weak Mutation Whole Process Long Time Language Model Reduction Method Reduction Effect System Support State Change Construction Materials Target Domain Hidden Data Happens-Before Programming Language Real-Time Operating System Shared Memory Transfer Effect Art Performance Automated Test Domain Adaptation Domain Information Context Information Data Race Java Programs Loss Of Effectiveness Large Domain Radio Propagation Source Code Generation Class Level Dynamic Binding Benchmark Datasets Data Augmentation Test Set Testing Device Efficient Testing Image Classifier Multi-Scale Loss Network Mission-Critical Applications Noise Strength Performance Comparison Reference Model Symmetric Multiprocessing Automated System Automated Tool Combined Model Development Tools Translation Model Test Case Generation Fine Details Facial Attributes Hb Analysis Multi-Domain N-Version Race Detection Sensor Network Simulator System Failure