ETRI-Knowledge Sharing Plaform

High Mobility Oxide Tfts Subthreshold Swing(SS) Turn-On Voltage Oxide Thin-Film Transistors Gate Insulator Next-Generation Pulsed Laser Ablation(PLA) Spatial Light Modulator(SLM) Transparent Thin Film Transistor(TTFT) 5 Nm Drain Current Glass Substrate Oxygen Vacancies Liquid Crystal Flexible Substrate Saturation Mobility Reflective Mode Hydrogen Doping Process Temperature I-V Characteristic(Transport property) Electronic Transport Properties High Performance STRETCHABLE ELECTRONICS Switching Characteristics Atomic Layer Deposition Method Electronic Structures Dual-Mode Organic Light-Emitting Diodes(OLEDS) Vdf-Trfe Electronic Properties Passivation Film Channel Layer As 2 Stability Characteristics Active Layer Indium Oxide Surrounding Environment Ambient Light Instability Modes Laser Lift-Off P-Type Phase Modulation Memory Array Amorphous Zno Flexible Backplane High Carrier Mobility Active Channel Vinylidene Fluoride-Co-Hexafluoropropylene(Poly) Conductive Paths Annealing Time Doping Density Excellent Performance Hybrid-Type High Accuracy High Density Integration Metal Oxide Semiconductor Near-Field Nanocomposite Thin Films Charge Barrier Channel Structure Adhesion Properties Back-Channel Etch Bias Dependence Device Structure Device Stability Electrically Controlled Birefringence Ferroelectric Memory Gate Electrode Graphene-Metal Graphene Anode High Growth Rate Instability Mechanism Zno Layer Microelectronic Devices Novel Method Polyethylene Naphthalate Surface Contamination Stability Enhancement Subgap States Thermal Atomic Layer Deposition Top-Gate Under-Sampling Ultra-Thin Annealing Temperature Digital Holography Double Layered Deformable Interconnects Free Space Gate Bias Stress Highly Conductive Metal Oxide Thin Films Non-Volatile Memory(NVM) Bottom Contact Amorphous Ingazno Dynamic Bias Flexible Thin Film Transistors Field Propagation High Electrical Performance Improved Stability Insulator Layer Linear Mobility Fourier Space Non-Uniform Sampling Organic Ferroelectric Reflection Mode Sno2 Nanoparticles Threshold Voltage Shift Tft Array Transfer Process Triple-Layer Active Matrix Display Binary Metal Oxide Electron Mobility Etch Stop Layer Electronic Product Fabrication Process Film Structure Gate Dielectric High-Resolution Low-Temperature Process Zno Thin Films On/Off Ratio Room-Temperature Vertical Channel Coupled With Contact Structure Drain Bias Electrical Contact Flexible Display High Stability Large-Area Electronics Negative Shift Oled Display Spherically Symmetric Subthreshold Slope(SS) Sampling Number Short Time Trade-Off Three Dimensional(3D) Semiconducting Channel Single-Sided Wave Propagation(WP) Connection System Amorphous Oxide Ferroelectric Polarization Active Materials Organic Transistor And Gate Donor Defects Flexible And Transparent Integrated Electronics Low Power Consumption Nanocomposite Structure Self-Assembling Stretchable Substrate Stable Operation Field-Effect Mobility Fabrication And Characterization Ionized Donors Integration Density Indium Zinc Oxide 20 Nm Metal Surface Oxygen Vacancy Concentration Organic-Inorganic Hybrid Plastic Substrate Process Optimization Processing Temperature End Functionality Bottom Gate Bias Instability Device Applications Dual-Functional Gate Pulse Growth And Transfer Non-Paraxial Oxygen Atmosphere Output Characteristics Real-World Superior Performance Thin Film Thermoelectric Switching Operation Charge Trapping Information Display Integrated System Liquid Precursor Wearable Device Memory Device Oxide Electronics Electronics Properties Emissive Layer(EL) Hybrid Thin Film Low Hysteresis Layered Films Positive Charge Pecvd Sinx Patterned Graphene First Stokes(S1) Structure Design Short Channel Sol-Gel Route Soft Platforms Technical Issues Wide Range Current Ratio Electric Power Generation Highly Stable Hydrogen Incorporation Very Large Scale Integration(VLSI) Memory Cell Mechanical Strain Electrical Stress Ferroelectric Gate Graphene Films Inorganic Semiconductors Large-Area Graphene Negative Bias Stress Numerical Error Selective Doping Transparent Memristor Soft Electronics Transparent Electrode Thermoelectric Materials Stress Test Sinx Passivation Superlattice Thin Films Transparent Electronics Transparent Oxide Technical Feasibility Working Pressure Dominant Mechanism Dielectric Layer Disturb-Free Degradation Behavior Heavy Metals Low-Cost Neutral Donor On-Current Performance And Reliability Angular Spectrum Aliasing Error Experiment Results Effective Channel Length Gen 2 Igzo Tfts Indium Zinc Tin Oxide(IZTO) Level Production 3 V Persistent Photoconductivity (Ppc) Simulation Results Uniform Switching