ETRI-Knowledge Sharing Plaform

High Mobility Oxide Tfts Subthreshold Swing(SS) Turn-On Voltage Oxide Thin-Film Transistors Gate Insulator Transparent Thin Film Transistor(TTFT) Saturation Mobility Spatial Light Modulator(SLM) Drain Current 5 Nm Glass Substrate Oxygen Vacancies Liquid Crystal Pulsed Laser Ablation(PLA) Flexible Substrate Next-Generation Active Channel Reflective Mode Hydrogen Doping Process Temperature I-V Characteristic(Transport property) Electronic Transport Properties STRETCHABLE ELECTRONICS Switching Characteristics Atomic Layer Deposition Method Dual-Mode Electronic Structures Organic Light-Emitting Diodes(OLEDS) Passivation Film As 2 Electronic Properties Vdf-Trfe Stability Characteristics Active Layer Indium Oxide Surrounding Environment Phase Modulation Ambient Light Instability Modes Laser Lift-Off Amorphous Zno Flexible Backplane High Carrier Mobility Memory Array Annealing Time Adhesion Properties Charge Barrier Conductive Paths Channel Structure Bias Dependence Back-Channel Etch Top-Gate Ultra-Thin Thermal Atomic Layer Deposition Device Structure Doping Density Device Stability Electrically Controlled Birefringence Excellent Performance Ferroelectric Memory Graphene-Metal Graphene Anode Hybrid-Type Gate Electrode High Accuracy Instability Mechanism High Density Integration High Growth Rate Microelectronic Devices Metal Oxide Semiconductor Novel Method Near-Field Nanocomposite Thin Films Vinylidene Fluoride-Co-Hexafluoropropylene(Poly) Polyethylene Naphthalate Under-Sampling Zno Layer Surface Contamination Subgap States Stability Enhancement Amorphous Ingazno Annealing Temperature Reflection Mode Bottom Contact Triple-Layer Transfer Process Insulator Layer Dynamic Bias Double Layered Digital Holography Deformable Interconnects Flexible Thin Film Transistors Free Space Field Propagation Fourier Space High Performance Gate Bias Stress High Electrical Performance Improved Stability Highly Conductive Linear Mobility Metal Oxide Thin Films Non-Volatile Memory(NVM) Non-Uniform Sampling Organic Ferroelectric Threshold Voltage Shift Tft Array Sno2 Nanoparticles Active Matrix Display Coupled With Contact Structure Binary Metal Oxide Trade-Off Three Dimensional(3D) Drain Bias Electron Mobility Electronic Product Electrical Contact Etch Stop Layer Flexible Display Fabrication Process Film Structure High Stability Gate Dielectric High-Resolution Low-Temperature Process Large-Area Electronics Negative Shift On/Off Ratio Oled Display Vertical Channel Semiconducting Channel Zno Thin Films Single-Sided Short Time Subthreshold Slope(SS) Sampling Number Spherically Symmetric Active Materials And Gate Amorphous Oxide Connection System Donor Defects Flexible And Transparent Ferroelectric Polarization Integrated Electronics Low Power Consumption Nanocomposite Structure Organic Transistor Wave Propagation(WP) Self-Assembling Stretchable Substrate Stable Operation Channel Layer Processing Temperature Bottom Gate Bias Instability Thin Film Thermoelectric Device Applications Dual-Functional End Functionality Field-Effect Mobility Fabrication And Characterization Gate Pulse Growth And Transfer Ionized Donors Indium Zinc Oxide Integration Density 20 Nm Metal Surface Non-Paraxial Oxygen Vacancy Concentration Output Characteristics Organic-Inorganic Hybrid Process Optimization Oxygen Atmosphere Plastic Substrate Real-World Superior Performance Switching Operation Pecvd Sinx Patterned Graphene Electronics Properties Emissive Layer(EL) Hybrid Thin Film Information Display Integrated System Layered Films Liquid Precursor Low Hysteresis Memory Device Oxide Electronics Positive Charge Technical Issues Structure Design Wearable Device Charge Trapping Short Channel Sol-Gel Route Soft Platforms First Stokes(S1) Current Ratio P-Type Transparent Electrode Technical Feasibility Thermoelectric Materials Electrical Stress Electric Power Generation Ferroelectric Gate Hydrogen Incorporation Graphene Films Highly Stable Inorganic Semiconductors Large-Area Graphene Memory Cell Mechanical Strain Negative Bias Stress Numerical Error Wide Range Transparent Electronics Transparent Memristor Transparent Oxide Selective Doping Soft Electronics Sinx Passivation Superlattice Thin Films Stress Test Angular Spectrum Aliasing Error Performance And Reliability Persistent Photoconductivity (Ppc) Uniform Switching Dominant Mechanism Effective Channel Length Dielectric Layer Disturb-Free Degradation Behavior Experiment Results Gen 2 Heavy Metals Igzo Tfts Indium Zinc Tin Oxide(IZTO) Low-Cost Level Production Neutral Donor On-Current Working Pressure 3 V Simulation Results