ETRI-Knowledge Sharing Plaform

High Performance Spatial Light Modulator(SLM) Digital Holography Channel Length Oxide Tfts STRETCHABLE ELECTRONICS High Field-Effect Mobility Data Line Organic Photodiode Digital Hologram Gate Line Complementary Metal-Oxide-Semiconductor(CMOS) Near-Infrared(NIR) Diethyl Zinc Optical Components Phase Change Material(PCM) Liquid Precursor Molybdenum Oxide Indium Tin Oxide(ITO) Electrical Characteristics Gate Insulator Holographic Display Specific Detectivity Photoactive Layer Low Noise Three Dimensional(3D) Oxygen Vacancies All-Oxide Subthreshold Slope(SS) Absorption Features Mixed Oxides Oxide Thin Films Pixel Structure Adhesion Properties Back-Channel Etch Charge Transfer Cathode Ray Tube Conductive Paths Low-Power Light Intensity Lossy Dielectric Layer Large Size Naked Eye Dry Etching Electron States Excellent Performance Holography System High-Speed Interface High Density Integration Quantum Dot(QD) Sputtering Process Absorption Profile Continuous Operation Cycle Ratio Light Waves Low Temperature(LT) Transfer Characteristics Transfer Process Next-Generation Oxide Field Non-Volatile Memory(NVM) Precursor Solution Deformable Interconnects Device Architecture Deposition Process Damp Heat Test Electrical Performance Full-Color X-Ray Photoelectron Spectroscopy High Definition High-Quality 460 Nm Reflection-Type Ultra-High Resolution Synergetic Contribution Quantitative Description Critical Coupling Charge Storage Large-Area Electronics Top Illumination Trade-Off Temporal Response Mixing Ratio Numerical Simulations Noise Equivalent Power Oxygen Plasma Oxygen-Deficient Oxide Channel Pixel Integration Emotional Experience P-Type Characteristics Perfect Absorption Double-Gate(DG) Erasing And Rewriting Electronic Product Electrical Contact Field-Effect Transistors(FETs) Fabrication Process Film Thickness High Responsivity 3d Object Ultrathin Layer Spectral Asymmetry Semiconductor Memory Subthreshold Swing(SS) Small Molecular Single-Sided Weak Light Voltage Drop Integrated Electronics Ald Process Ald Method Broadband Applications Connection System Cross Talk Key Components Thin-Film Phototransistors(TFPT) Metal Oxide Thin-Film Transistors Memory Structure Novel Material Organic Transistor Device Fabrication 10-Phenanthroline(BCP) Functional Additive Glass Substrate Hall Mobility Rapid Development 3d Image Self-Assembling Stretchable Substrate Integration Density Image Data Bottom Gate Color-Selective Channel Layer Top-Illuminated Trapped Electron(TE) Thin-Film Photodiode Multi-Band Plasma-Enhanced Atomic Layer Deposition Zinc Oxide(ZnO) Persistent Photoconductivity Plasma-Enhanced Ald Power Integrated Circuits Performance Degradation Dual-Functional Display Panel Device Properties Device Performance Energy-Efficient End Functionality Frequency Range Gate Bias 20 Nm Real-World Metal Surface Display System Superior Performance Visible Range Integrated System Indium Oxide Image Sensor Absorption Properties Amorphous Oxide Semiconductor Binary Pattern Best Performance Computer Generated Holograms(CGH) Charge Extraction Laser Writing Tin (Iv) Oxide Tri-Layer Numerical Study Oxide Electronics Optical Simulation Hyper-Realistic Etching Damage Fingerprint Sensor High Mobility Hole Mobility High External Quantum Efficiency Comparative Study Subwavelength Metallic Gratings Spectral Absorption Wearable Device Inorganic Semiconductors Image Hologram Active Layer Thickness Active Matrix Channel Width Coupling Conditions Channel Potential Liquid Crystal Two-Dimensional Image Mechanical Strain Photo-Generated Holes Highly Stable Dark Current High Refractive Index High-Resolution Displays High Photoresponsivity 9-Dimethyl-4 Stable Performance Small Size Soft Electronics Structural Parameters Wide Viewing Angle Vacuum Deposition Absorption Characteristic Bulk Heterojunction Current Injection Neuromorphic Hardware K-Doped Low-Cost Linear Dynamic Range Large Display Manufacturing Processes Memristor Device Operational Stability Proof-Of-Concept Performance And Reliability Thin Structure High-Capacity Resonant Cavity 20th Century 7-Diphenyl-1 Film Formation Detection Band Ultraviolet Laser Still Image Simulation Results Solution-Processed