ETRI-Knowledge Sharing Plaform

Quantum Key Distribution Single Photon Source Laser Diode(LD) Silicon-Based Reference Frame Electron Channeling Contrast Imaging Threading Dislocations(TDs) Silicon Carbide(3C-SiC) Beam Tracking Metalorganic Chemical Vapor Deposition Free Space III-V Stand-Alone Photon Sources Photonic Circuits Thermal Cycle Annealing Optimal Thickness Gaas On Si Inas/Gaas Quantum Dot Hybrid Technique Surface Roughness Planar Lightwave Circuit(PLC) Continuous Wave(CW) Creative Technology Quantum Communication On-Chip Tracking System Threading Dislocation Density Atomically Flat Surface Threshold Current Density System Integrated Inverted Pyramid Optical Source Optical Packaging Photonic Devices Quantum-Well Laser Space Link Epitaxial Layers Gaas Films Integrated Optical Circuits Indium Gallium Arsenide Light Source Low Temperature(LT) Mems-Based Quantum States Self-Assembled Silica-Based Annealing Process Active Compensation Two-Step Growth Fiber-Based Hybrid Integration Nucleation Layer Quantum Information Room-Temperature Silicon Photonics Surface Morphology Aluminum Gallium Arsenide Epitaxially Grown Force Microscopy Inas Quantum Dots Inas Qds Indium Gallium Phosphide Lattice Matched Monolithic Integration Noise Filtering Optical Analysis Quantum Simulation Quantum Computation Quantum Devices Quantum Dot Laser Real-Time Building Block Transfer Technique Growth Temperature Fast Steering Mirror High Temperature Highly Strained Laser Applications Operation Condition Substrate Thickness Systematic Study Atomic Force Microscope(AFM) Active Polarization Cavity Length Cmos-Compatible Cladding Layer High Quantum Efficiency Maximum Output Power Optical Misalignment Random Position Selective Area Growth Strained Layer Smooth Surface Challenging Issues Wafer-Scale Integration Essential Element Heterogeneous Integration Very Large Scale Integration(VLSI) Pulsed Operation Root Mean Square Value Site-Controlled Qds Transmitter And Receiver 1550 Nm Variable Optical Attenuator(VOA) Fabry-Perot Cavity High Speed Imaging Method Multi-Polarization Micro-Optics Material Quality Single Photon Emitters Semiconductor Quantum Dots Size Distribution Si Substrate