Subjects : Negative bias stress
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2024 | Benzylphosphonic acid treated ultra-thin ALD-InOx for long term device stability Juhun Lee Journal of Materials Chemistry C, v.12, no.31, pp.11928-11937 | 1 | 원문 |
| Conference | 2015 | The Highly Stable InGaZnO TFTs Deposited by High Density Plasma Sputtering Cho Sung Haeng International Thin-Film Transistor Conference (ITC) 2015, pp.17-18 | ||
| Journal | 2012 | Improved Stability of Atomic Layer Deposited ZnO Thin Film Transistor by Intercycle Oxidation Oh Himchan ETRI Journal, v.34, no.2, pp.280-283 | 16 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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