Subjects : Stable characteristics
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Conference | 2011 | Drain Bias Induced Instability Characteristics in Oxide Thin Film Transistors Yang Shinhyuk International Meeting on Information Display (IMIT) 2011, pp.115-116 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
| Registered | 2006 | SCHOTTKY BARRIER TUNNEL TRANSISTOR AND METHOD OF MANUFACTURING THE SAME | UNITED STATES |
| Type | Year | Research Project | Primary Investigator | Download |
|---|---|---|---|---|
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