Subjects : degradation behavior
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2013 | Unusual Instability Mode of Transparent All Oxide Thin Film Transistor under Dynamic Bias Condition Oh Himchan Applied Physics Letters, v.103, no.12, pp.1-5 | 3 | 원문 |
| Conference | 2006 | The Abnormal Degradation Behavior of ZnO TFT Under Gate Bias Stress Hwang Chi-Sun The Electrochemical Society (ECS) Meeting 2006, pp.301-305 | 2 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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