Subjects : H TFT
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2008 | Effects of Gate Bias Stress on the Electrical Characteristics of ZnO Thin Film Transistor 전재홍 Journal of the Korean Physical Society, v.53, no.1, pp.412-415 | 8 | 원문 |
| Conference | 2008 | P‐22: Electrical Stability of ZnO TFT during Gate‐Bias Stress 김태현 Society for Information Display (SID) International Symposium 2008, pp.1250-1253 | 1 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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