Subjects : charging dynamics
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2007 | Analysis of Interface Trap States at Schottky Diode by using Equivalent Circuit Modeling Jun Myung Sim Journal of Vacuum Science and Technology B, v.25, no.1, pp.82-85 | 5 | 원문 |
| Conference | 2006 | New Analysis on the Interface Trap States at Schottky Contact Jun Myung Sim International Conference on the Physics of Semiconductors (ICPS) 2006, pp.1-2 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
|---|---|---|---|---|---|
| No search results. | |||||
| Type | Year | Research Project | Primary Investigator | Download |
|---|---|---|---|---|
| No search results. | ||||