Subject

Subjects : test pattern

  • Articles (4)
  • Patents (0)
  • R&D Reports (0)
논문 검색결과
Type Year Title Cited Download
Journal 2022 Calibration of a multiview display with a tilted parallax barrier for reduction of nonlinear extrinsic crosstalk   Joonsoo Kim  Applied Optics, v.61, no.31, pp.9112-9123 2 원문
Conference 2020 P‐63: Measurements of Viewing Angle and Angular Resolution of Electronic Holographic Display   Nam Jeho  Society for Information Display (SID) International Symposium 2020, pp.1580-1583 0 원문
Conference 2019 Reliability-Enhanced Test Pattern Scheme for Holographic Display Measurement   Nam Jeho  International Display Research Conference (EuroDisplay) 2019, pp.1-1
Journal 2012 Evaluation of Seebeck coefficients in n- and p-type silicon nanowires fabricated by complementary metal–oxide–semiconductor technology   Hyun Younghoon  Nanotechnology, v.23, no.40, pp.1-7 13 원문
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연구보고서 검색결과
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