|
Journal
|
2010 |
In-Situ Transmission Electron Microscopy Investigation of the Interfacial Reaction between Er and SiO2 Films
최철종 Materials Transactions, v.51, no.4, pp.793-798 |
3 |
원문
|
|
Journal
|
2007 |
Electrical and Structural Properties of High-k Er-silicate Gate Dielectric Formed by Interfacial Reaction between Er and SiO2 Films
Choi Chel-Jong Applied Physics Letters, v.91, no.1, pp.1-3 |
17 |
원문
|
|
Journal
|
2006 |
Rare-Earth Gate Oxides for GaAs MOSFET Application
권광호 Applied Surface Science, v.252, no.21, pp.7624-7630 |
4 |
원문
|