Subjects : electrical bias
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2013 | Comparative studies on electrical bias temperature instabilities of In–Ga–Zn–O thin film transistors with different device configurations Ryu Min Ki Solid-State Electronics, v.89, pp.171-176 | 21 | 원문 |
| Conference | 2008 | 42.3: Transparent ZnO Thin Film Transistor for the Application of High Aperture Ratio Bottom Emission AM‐OLED Display Park Sang-Hee Society for Information Display (SID) International Symposium 2008, pp.629-632 | 39 | 원문 |
| Conference | 2008 | P‐22: Electrical Stability of ZnO TFT during Gate‐Bias Stress 김태현 Society for Information Display (SID) International Symposium 2008, pp.1250-1253 | 1 | 원문 |
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