Subjects : Temperature Stress
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2025 | Investigation of Chlorine-Induced Damage in Oxide Semiconductor Transistors Na Jae Won ACS Applied Electronic Materials, v.7, no.13, pp.6128-6136 | 0 | 원문 |
| Journal | 2015 | Highly Stable, High Mobility Al:SnZnInO Back-Channel Etch Thin-Film Transistor Fabricated Using PAN-Based Wet Etchant for Source and Drain Patterning Cho Sung Haeng IEEE Transactions on Electron Devices, v.62, no.11, pp.3653-3657 | 38 | 원문 |
| Journal | 2013 | Comparative studies on electrical bias temperature instabilities of In–Ga–Zn–O thin film transistors with different device configurations Ryu Min Ki Solid-State Electronics, v.89, pp.171-176 | 21 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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