Subjects : nano-silicon
Type | Year | Title | Cited | Download |
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Conference | 2011 | Chromatic Dispersion Measurement of Nano-Silicon Waveguides Using a White-Light Interferometry Method Seung Hwan Kim Optoelectronic Integrated Circuits XIII (SPIE 7942), pp.1-7 | 2 | 원문 |
Journal | 2007 | Thermal Annealing Effects on the Electrical Characteristics of the Back Interface in Nano-silicon-on-insulator Channel 조원주 Applied Physics Letters, v.90, no.14, pp.1-3 | 9 | 원문 |
Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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Type | Year | Research Project | Primary Investigator | Download |
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