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KOREAN

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Kim Gibeom
Department
ICT-enabled Intelligent Manufacturing Research Section
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논문 검색결과
Type Year Title Cited Download
Conference
2024 Defect Detection Accuracy Analysis According to FWHM and Depth Using Phasemap and Unwrapped Phasemap   김기범   한국통신학회 종합 학술 발표회 (추계) 2024, pp.1-2