ETRI-Knowledge Sharing Plaform

Bias Temperature Stress Trap States 3 V Memory Applications Bias Stress Chemical Damage O 1s Subthreshold Swing(SS) Morphological Degradation 48 V Cl Incorporation Oxide Semiconductor Threshold Voltage(Vth) Ferroelectric Field-Effect Transistor Indium Gallium Zinc Oxide(IGZO) Need For Deep Level Titanium Nitride Electrical Performance Next-Generation Positive Bias Surface Analysis Defect States Negative Bias Potential Failures Failure Mechanisms Xps Depth Profiling Dynamic Random-Access Memory(DRAM) Plasma Treatment Memory Device