ETRI Knowledge Sharing Platform : Lim Seonghwan

Researchers

연구자 검색
Keyword

Lim Seonghwan Post-doc

KSP Keywords: Electrical Characteristics 3 V Oxide Thin-Film Transistors Short Annealing Effective Temperature(ET) Subthreshold Swing(SS) Thermal Annealing Gate Bias Stress Time-Dependent Low Temperature Threshold Voltage(Vth) High Performance Postdeposition Annealing(PDA) Annealing Technique Next-Generation Tungsten Oxide Energy-Efficient Oxide Electronics Hybrid Microwave Annealing Charge Trapping Annealing Process On/Off Current Ratio Device Reliability Field-Effect Mobility

논문 검색결과
Type	Year	Title	Cited	Download
Journal	2025	Low-temperature hybrid microwave annealing process for high-performance indium–tungsten oxide thin-film transistors Hyun-Sik Choi, Seong-Hwan Lim Applied Physics Letters, v.127, no.9, pp.1-7	0

218 Gajeong-ro, Yuseong-gu, Daejeon, 34129, KOREA, Contact: sh.kim@etri.re.kr

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