ETRI-Knowledge Sharing Plaform

Low Temperature(LT) High Performance Color Filters Inkjet Printing White Oleds Flash Lamp Annealing(FLA) Thin Film Encapsulation Solution-Processed Indium Oxide Printing Process Full-Color Wide Color Gamut Small Form Factor Augmented Reality(AR) Optical Loss On/Off Ratio Carrier Concentration Optical Sensors Quantitative Measurement Sensor Based Device Performance Oxide Tfts Optical Crosstalk Indium Nitrate In-Ga-Zn-O(IGZO) Trench Structure Annealing Effects Si Substrate Current Efficiency Encapsulation Process Zinc Hydroxide Electrical Performance X-Ray Photoelectron Spectroscopy (Xps) Annealing Process Conversion Layers Insertion Loss Oled Display Planar Lightwave Circuit(PLC) Room-Temperature Self-Assembled Monolayers(SAMs) Subthreshold Swing(SS) High Aspect Ratio Optical And Electrical Properties Pixel Array Device Characteristics Indium Zinc Oxide Optical Properties Post-Annealing Single Mode White Organic Light-Emitting Diodes Display Module Mass Production First Stokes(S1) Active Devices Gate Insulator High Contrast Ratio Intermediate Electrodes Measurement Condition O 1s Pre-Annealing Scattering Particles Transparent Electrode Bilayer Structure Flexible Substrate Field Of View(FOV) Low-Cost Nitrate Solutions Optical Splitter Oxide Film Solution Temperature Annealing Time Halide Perovskite Quantum Dots Application Areas Bias Current Blue Color Ag Thin Film Crystallite Size Colloidal Quantum Dot(CQD) Flexible Device Full-Width At Half-Maximum(FWHM) Graphene Anode High-Luminance Inorganic Thin Films Low Leakage Current Low Surface Roughness Photonic Devices Perovskite Nanocrystals Particle Control Photolithography Process Protection Layer Surface Contamination Transmission Electron Microscopy(TEM) Top-Emitting Organic Light-Emitting Device(TE-OLED) Transport Characteristics Visible Light Zinc Oxide Layer Ionic Impurities Annealing Temperature Blue Emission Charge Injection Efficiency Capping Layer Creative Technology Dipole Orientation Enhanced Efficiency Efficiency And Quality Electrical Transport Electron Injection Emission Characteristics High Power Head-Mounted Highly Conductive Luminance Compensation Metal Oxide Thin Films Mixed Layer Next-Generation National Television Oxide Field Quantum Yields(QYs) Pl Spectrum Rgb Color Red Light Rapid Response Stacked Oled Solution-Processed Devices Transistor Characteristics Ultraviolet-Ozone Treatment Cost-Effective Temperature Distribution Active Area After Treatment Blue Spectrum Bridge Safety Dye-Doped Driving Voltage Flexible Display Flexible Oleds Film Thickness Field-Effect Transistors(FETs) High Current Light-Emitting Structure Luminescence Efficiency Led Applications New Approach Oxide Channel Output Power Organic Devices Oxide Formation Passivation Layer QD-LED Recent Progress Scanning Electron Microscopy(S.E.M.) Stretchable Displays State-Of-The-Art Turn-On Voltage Top Electrode Vertical Stacking X-Ray Photoemission Spectroscopy Zno Thin Films Titanium Nitride Blue Light-Emitting Change Of Refractive Index Cut-Off Frequency Color Conversion Layer Force Microscopy High-Density Hole Injection Irradiation Time Metal Oxide Thin-Film Transistors Low Power Consumption Metal Thin Film Nanoparticle Composite Night Vision Organic Light-Emitting Diode Display Nitrogen Defects On/Off Current Ratio Oxygen Vacancies Optoelectronic Performance Source/Drain Electrodes Sub-Micron Thin Lens Thin Metal Layer Virtual Reality Applications 4-Vinyl Phenol(Poly) Aluminium Oxide Augmented Cognition Coated Film Decomposition Temperature Direct Patterning Fast Response Time Growth And Transfer Horizontal Dipole Impedance Spectra Large Grain Mixed Halide Perovskite Metal Interface Optical Reflectance Oxide Precursors Optical Components Optical Efficiency Organic-Inorganic Hybrid Prediction Model Polymer Chain Practical Use Plasma-Enhanced Atomic Layer Deposition Refractive Index Sensor Rod-Shaped Spin Speed Solution-Processed Tfts Structural Design Spectrum Bandwidth Wireless Sensor Wide Fov Time Of Flight Secondary Ion Mass Spectrometry(ToF-SIMS) Aqueous Solution Atomic Force Microscope(AFM) And Virtual Reality Charge Transport Display Applications Digital Camera Electroluminescence Spectrum Emissive Layer(EL) Hybrid Thin Film Interface Engineering Microcavity Effect Metal Films Oxide Gate Dielectric Organic Diodes Organic Photovoltaics(OPVs) Optical Design Optical Simulation Optimal Thickness Patterning Technique Pixel Circuit Patterned Graphene Reverse Bias Spin-Coated Silicon Substrate Stacked Structure Sub-Pixel Sheet Resistance Smooth Surface Thermally Evaporated Three-Wavelength Technology Status Tin Layer Wide Field Ambient Conditions Carrier Mobility Current State Distributed Bragg Reflector Display Technology Flexible Electronics Electrical Characteristics Graphene Films Hole Trap High Order High-Resolution Displays Light-Emitting Materials Low Voltage Manufacturing Cost Large-Area Graphene Metal Electrode Metal Anode Oled Technology Optoelectronic Devices Precursor Film Safety Management Production Operations Red Phosphorescent Red Emission Self-Luminescence Spectral Bandwidth Thick Aluminum Technical Feasibility Tandem Structure Uv-Ozone U-Bend Waveguide 000 Rpm Zinc Oxide Nanoparticle Wide Range Trap Levels 3 V 1550 Nm Future Prospects Igzo Tfts Anode Materials Aperture Ratio Cmos Process Crack Propagation Electrical Devices Fine Metal Mask Film Formation Gen 2 Hole Transporting Layer High Frequency(HF) Igzo Thin Film High Color Purity I-Line Improved Performance Metal-Oxygen Level Production Measuring Equipment Manufacturing Processes Non-Destructive Organic Interfaces Operational Stability Organic Thin-Film Transistors Perovskite Nanoparticles Plasma-Enhanced Chemical Vapor Deposition (Pecvd) Polymer Layer Sol-Gel Reaction Transport Behavior Various Substrates Water Vapor Transmission Rate Zno Films