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Conference
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2015 |
The Effect of Post-Annealing on Bias Stability of InOx/ZnO Superlattice Thin Film Transistors Grown by Plasma Enhanced Atomic Layer Deposition
Hwan-Jae Lee
Asian-European International Conference on Plasma Surface Engineering (AEPSE) 2015, pp.1-1 |
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Conference
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2015 |
Growth Characteristics and Electrical Properties of Indium Oxide and Zinc Oxide Superlattice Thin Films by Plasma Enhanced Atomic Layer Deposition
Jeong-Mu Lee
Asian-European International Conference on Plasma Surface Engineering (AEPSE) 2015, pp.1-1 |
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Conference
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2016 |
Demographic Transition: Introducing Multi-agent Based BDI Platform
Mazhar Sajjad
International Conference on Modelling, Identification and Control (MIC) 2016, pp.1-9 |
0 |
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Conference
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2016 |
A Sophisticated Packet Forwarding Scheme with Deep Packet Inspection in an OpenFlow Switch
ChoongHee Cho
International Conference on Software Networking (ICSN) 2016, pp.1-5 |
10 |
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Journal
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2016 |
Postfabrication Trimming of CMOS-Compatible Athermal MZI by Thermal Annealing
Jong-Moo Lee
IEEE/OSA Journal of Lightwave Technology, v.34, no.4, pp.1288-1292 |
6 |
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Journal
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2016 |
Design and Implementation of an Integrated Reconfigurable Silicon Photonics Switch Matrix in IRIS Project
Francesco Testa IEEE Journal of Selected Topics in Quantum Electronics, v.22, no.6, pp.1-14 |
53 |
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Journal
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2015 |
Fabrication and Electrical Properties of an AlGaN/GaN HEMT on SiC with a Taper-Shaped Backside Via Hole
Byoung-Gue Min
Journal of the Korean Physical Society, v.67, no.4, pp.718-722 |
2 |
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Journal
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2015 |
Stabilization of Panoramic Videos from Mobile Multi-Camera Platforms
Ameer Hamza Image and Vision Computing, v.37, pp.20-30 |
23 |
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Journal
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2015 |
Quality Assessment of Images Projected Using Multiple Projectors
Muhammad Umer Kakli KSII Transactions on Internet and Information Systems, v.9, no.6, pp.2230-2250 |
1 |
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Journal
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2015 |
Fabrication of a Membrane Filter with Controlled Pore Shape and its Application to Cell Separation and Strong Single Cell Trapping
Dong-Hoon Choi Journal of Micromechanics and Microengineering, v.25, no.10, pp.1-11 |
12 |
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