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논문 검색결과
Type Year Title Cited Download
Journal
2009 Supercapacitive Properties of Composite Electrodes Consisting of Polyaniline, Carbon Nanotube, and RuO2   Jang Myoun Ko  Journal of Applied Electrochemistry, v.39, no.8, pp.1331-1337 45
Journal
2009 Upper Bounds on the Symbol-Error Probability of MPSK with Phase Error using Pawula F-Function IV   Seung Keun Park   IEEE Transactions on Communications, v.57, no.8, pp.2198-2203 1
Journal
2009 High performance thin film transistor with cosputtered amorphous Zn–In–Sn–O channel: Combinatorial approach   Min Ki Ryu   Applied Physics Letters, v.95, no.7, pp.072104-1-072104-3 119
Journal
2009 Electrochemical properties of mixed cathode consisting of μm-sized LiCoO2 and nm-sized Li[Co0.1Ni0.15Li0.2Mn0.55]O2 in lithium rechargeable batteries   Kwang Man Kim   Journal of Applied Electrochemistry, v.39, no.9, pp.1487-1495 13
Journal
2009 Improvement of operational stability in SET states of phase-change-type nonvolatile memory devices using Sb-rich phase of Ge–Sb–Te alloys   Sung Min Yoon   Solid-State Electronics, v.53, no.5, pp.557-561 6
Journal
2009 Reception Power Estimation Using Transmitter Identification Signal for Single Frequency Network   Sung Ik Park   IEEE Transactions on Broadcasting, v.55, no.3, pp.652-655 18
Journal
2009 Associative Naïve Bayes classifier: Automated linking of gene ontology to medline documents   Hyun Ki Kim   Pattern Recognition, v.42, no.9, pp.1777-1785 18
Journal
2009 Fabrication and Electrical Properties of Ordered Two-Dimensional Hollow ZnO Shells’ Arrays   Jae Hyun Moon   Journal of Physics and Chemistry of Solids, v.70, no.8, pp.1166-1170 1
Journal
2009 Automated Speaker Recognition for Home Service Robots Using Genetic Algorithm and Dempster–Shafer Fusion Technique   Yanmei Zhan  IEEE Transactions on Instrumentation and Measurement, v.58, no.9, pp.3058-3068 41
Journal
2009 Charge Transfer and Trapping Properties in Polymer Gate Dielectrics for Non-Volatile Organic Field-Effect Transistor Memory Applications   Kang Jun Baeg  Solid-State Electronics, v.53, no.11, pp.1165-1168 23