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Journal
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2015 |
Back-Thinning Process Research and Characteristics Measurement of Thin Sensor
전혜빈 Journal of the Korean Physical Society, v.67, no.12, pp.2065-2069 |
0 |
원문
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Journal
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2012 |
Low Temperature Characteristics of Schottky Barrier Single Electron and Single Hole Transistors
Jang Moon Gyu ETRI Journal, v.34, no.6, pp.950-953 |
1 |
원문
|
|
Journal
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2007 |
Thermal Annealing Effects on the Electrical Characteristics of the Back Interface in Nano-silicon-on-insulator Channel
조원주 Applied Physics Letters, v.90, no.14, pp.1-3 |
9 |
원문
|