Subject

Subjects : edge termination

  • Articles (6)
  • Patents (0)
  • R&D Reports (0)
논문 검색결과
Type Year Title Cited Download
Journal 2025 Radiation hardness of 1.2 kV SiC power devices with advanced edge termination structures under proton irradiation   김상엽  Journal of Semiconductors, v.권호미정, pp.1-7 원문
Conference 2025 Effects of Proton Irradiation on SiC Power Devices with Various Edge Termination Structures   김상엽  International Symposium on Power Semiconductor Devices and ICs (ISPSD) 2025, pp.565-568
Journal 2019 Fabrication of 5,000V, 4-Inch Light Triggered Thyristor using Boron Diffusion Process and its Characterization   Park Kun Sik  전력전자학회논문지, v.24, no.6, pp.411-418 원문
Conference 2015 Breakdown Characteristics of Edge Termination (Single/Double Zone JTE) with Doping concentration and Interface charge for 1700V 4H-SiC Schottky Diode   Won Jong Il  대한전자공학회 종합 학술 대회 (하계) 2015, pp.212-214
Journal 2012 Variation in the Electrical Properties of 100 V/100 a Rated Mesh and Stripe TDMOSFETs (Trench Double-Diffused MOSFETs) for Motor Drive Applications   Na Kyoung Il  Journal of the Korean Physical Society, v.60, no.10, pp.1508-1512 0 원문
Conference 2011 Variation of Electrical Properties with Edge Termination in Mesh Type Trench Double Diffused MOSFETs (TDMOS) for High Power Application   Na Kyoung Il  한국진공학회 학술 대회 (동계) 2008, pp.110-110
특허 검색결과
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