Subjects : Failure mechanisms
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2025 | Investigation of Chlorine-Induced Damage in Oxide Semiconductor Transistors Na Jae Won ACS Applied Electronic Materials, v.7, no.13, pp.6128-6136 | 0 | 원문 |
| Conference | 2017 | Silica Filler Content in NCP and its Effects on the Reliability of 3D TSV Multi-Stack under Thermal Shock Test 주니어 Electronics Packaging Technology Conference (EPTC) 2017, pp.1-8 | 8 | 원문 |
| Conference | 2013 | Analysis of CNT Emitter-Based Miniature X-Ray Tubes for Stable and Reliable Operation Kang Jun Tae International Vacuum Nanoelectronics Conference (IVNC) 2013, pp.1-2 | 1 | 원문 |
| Journal | 2010 | Direct Observation of Microscopic Change Induced by Oxygen Vacancy Drift in Amorphous TiO2 Thin Films Hu Young Jeong Applied Physics Letters, v.97, no.4, pp.1-3 | 43 | 원문 |
| Status | Year | Patent Name | Country | Family Pat. | KIPRIS |
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| Type | Year | Research Project | Primary Investigator | Download |
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