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Journal
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2014 |
Analysis of the Degradation of AlGaN/GaN HEMTs by High-temperature Operation Tests
Jongmin Lee Journal of the Korean Physical Society, v.64, no.10, pp.1446-1450 |
3 |
원문
|
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Journal
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2009 |
Enhancement of Program Speed in Dopant-Segregated Schottky-Barrier (DSSB) FinFET SONOS for NAND-Type Flash Memory
최성진 IEEE Electron Device Letters, v.30, no.1, pp.78-81 |
20 |
원문
|
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Conference
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2008 |
High Speed Flash Memory and 1T-DRAM on Dopant Segregated Schottky Barrier (DSSB) FinFET SONOS Device for Multi-functional SoC Applications
최성진 International Electron Devices Meeting (IEDM) 2008, pp.1-4 |
17 |
원문
|