Subjects : mobility fluctuation
| Type | Year | Title | Cited | Download |
|---|---|---|---|---|
| Journal | 2012 | Current Stress Induced Electrical Instability in Transparent Zinc Tin Oxide Thin-Film Transistors Cheong Woo-Seok Journal of Nanoscience and Nanotechnology, v.12, no.4, pp.3421-3424 | 18 | 원문 |
| Journal | 2009 | Comparative Study of the Low-Frequency-Noise Behaviors in a-IGZO Thin-Film Transistors With Al2O3 and Al2O3/SiNx Gate Dielectrics 조인탁 IEEE Electron Device Letters, v.30, no.8, pp.828-830 | 45 | 원문 |
| Journal | 2009 | Low-Frequency Noise in Amorphous Indium–Gallium–Zinc-Oxide Thin-Film Transistors 이정민 IEEE Electron Device Letters, v.30, no.5, pp.505-507 | 63 | 원문 |
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| Type | Year | Research Project | Primary Investigator | Download |
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