Subjects :
electrical stress
논문 검색결과
| Type |
Year |
Title |
Cited |
Download |
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Conference
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2021 |
Selective Doping in Drain Region of Amorphous Oxide Thin- Film Transistor by Electrical Stress under Illumination
Oh Himchan International Display Workshops (IDW) 2021, pp.196-198 |
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Journal
|
2010 |
Device Reliability under Electrical Stress and Photo Response of Oxide TFTs
Park Sang-Hee Journal of the Society for Information Display, v.18, no.10, pp.779-788 |
12 |
원문
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|
Journal
|
2007 |
Degradation Analysis in Asymmetric Sampled Grating Distributed Feedback Laser Diodes
주한성 Microelectronics Journal, v.38, no.6-7, pp.740-745 |
0 |
원문
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Journal
|
2006 |
Significance of Gate Oxide Thinning below 1.5 nm on 1/ f Noise Behavior in n-Channel Metal–Oxide–Semiconductor Field-Effect Transistors under Electrical Stress
Bongki Mheen Japanese Journal of Applied Physics, v.45, no.6A, pp.4943-4947 |
0 |
원문
|
특허 검색결과
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Family Pat. |
KIPRIS |
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연구보고서 검색결과
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Year |
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