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논문 검색결과
Type Year Title Cited Download
Journal
2009 Efficient Key Detection Method in the Correlation Electromagnetic Analysis Using Peak Selection Algorithm   You Sung Kang   Journal of Communications and Networks, v.11, no.6, pp.556-563 0
Journal
2010 Achieving Maximum System Throughput with Cooperative Relaying: A Case Study of IEEE 802.16j Multi-Hop Relay   Hyun-Seok Ryu  Journal of Communications and Networks, v.12, no.5, pp.466-474 4
Conference
2010 Dynamic Home Network Prefix Assignment for Multi-homing in Proxy Mobile IPv6   Yong-Geun Hong   International Wireless Communications and Mobile Computing Conference (IWCMC) 2010, pp.885-889 0
Journal
2015 Tag-Reader Mutual Authentication Protocol for Safe RFID/USN Environments   Hyo-chan Bang   Information : An International Interdisciplinary Journal, v.18, no.12, pp.5103-5116 0
Journal
2010 A 9-bit 80 MS/s Successive Approximation Register Analog-to-Digital Converter With a Capacitor Reduction Technique   Young-Kyun Cho   IEEE Transactions on Circuits and Systems II : Express Briefs, v.57, no.7, pp.502-506 44
Journal
2010 A Hardware-Efficient Pattern Matching Architecture Using Process Element Tree for Deep Packet Inspection   Seongyong AHN  IEICE Transactions on Communications, v.E93.B, no.9, pp.2440-2442 2
Journal
2010 A Pattern Partitioning Algorithm for Memory-Efficient Parallel String Matching in Deep Packet Inspection   HyunJin KIM  IEICE Transactions on Communications, v.E93.B, no.6, pp.1612-1614 9
Journal
2010 Characterization of Nonvolatile Memory Behaviors of Al/Poly(vinylidene fluoride-trifluoroethylene)/Al2O3/ZnO Thin-Film Transistors   Sung-Min Yoon   Japanese Journal of Applied Physics, v.49, no.4 PART 2, pp.1-6 20
Journal
2010 Effect of Gas Mixing Ratio on Etch Behavior of Y2O3 Thin Films in Cl2/Ar and BCl3/Ar Inductively Coupled Plasmas   Moonkeun Kim  Japanese Journal of Applied Physics, v.49, no.8 PART 2, pp.1-6 5
Journal
2010 Automatic Media Data Rating Based on Class Probability Output Networks   Harvey Rosas  IEEE Transactions on Consumer Electronics, v.56, no.4, pp.2296-2302 9