Subjects :
Depth profiling (DP)
논문 검색결과
| Type |
Year |
Title |
Cited |
Download |
|
Journal
|
2025 |
Investigation of Chlorine-Induced Damage in Oxide Semiconductor Transistors
Na Jae Won ACS Applied Electronic Materials, v.7, no.13, pp.6128-6136 |
0 |
원문
|
|
Journal
|
2021 |
Identification of a Multi-stack Structure of Graphene Electrodes Doped Layer-by-layer with Benzimidazole and Its Implication for the Design of Optoelectronic Devices
Hyunsu Cho Optics Express, v.29, no.15, pp.23131-23141 |
1 |
원문
|
|
Journal
|
2020 |
Unraveling Interface Characteristics of Zn(O,S)/Cu(In,Ga)Se2 at Nanoscale: Enhanced Hole Transport by Tuning Band Offsets
김주란 Applied Surface Science, v.509, pp.1-6 |
11 |
원문
|
|
Journal
|
2015 |
CCQM pilot study CCQM-P140: quantitative surface analysis of multi-element alloy films
김경중 Metrologia, v.52, no.Technical Suppl., pp.1-28 |
|
원문
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Journal
|
2013 |
Accurate Quantification of Cu(In,Ga)Se2 Films by AES Depth Profiling Analysis
장종식 Applied Surface Science, v.282, pp.777-781 |
8 |
원문
|
|
Conference
|
2011 |
Compositional SIMS Depth Profiling of CIGS film
김경중 한국진공학회 학술 대회 (동계) 2011, pp.367-367 |
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|
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Conference
|
2010 |
Fabrication and Characterization of Compound Semiconductor CIGS Thin Film Photovoltaic Devices
Kim Je Ha 대한전자공학회 종합 학술 대회 (하계) 2010, pp.1992-1995 |
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Journal
|
2002 |
Microstructure and Electrical Properties of Low Temperature Processed Ohmic Contacts to p-Type GaN
Miran Park ETRI Journal, v.24, no.5, pp.349-359 |
11 |
원문
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특허 검색결과
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연구보고서 검색결과
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