Subject

Subjects : Depth profile

  • Articles (5)
  • Patents (1)
  • R&D Reports (0)
논문 검색결과
Type Year Title Cited Download
Journal 2024 Effect of the Post-Annealing Temperature on the Interfacial Reaction Between a High Tc Superconductor and Topological Insulator   Lee Woo Jung  Advanced Electronic Materials, v.10, no.7, pp.1-9 4 원문
Journal 2021 Evolution of Morphological and Chemical Properties at p–n Junction of Cu(In,Ga)Se2 Solar Cells with Zn(O,S) Buffer Layer as a Function of KF Postdeposition Treatment Time   Lee Woo Jung  ACS Applied Materials & Interfaces, v.13, no.41, pp.48611-48621 11 원문
Journal 2014 Na Effect on Flexible Cu(In,Ga)Se2 Photovoltaic Cell Depending on Diffusion Barriers (SiOx, i-ZnO) on Stainless Steel   Lee Woo Jung  Materials Chemistry and Physics, v.147, no.3, pp.783-787 13 원문
Journal 2013 Accurate Quantification of Cu(In,Ga)Se2 Films by AES Depth Profiling Analysis   장종식  Applied Surface Science, v.282, pp.777-781 8 원문
Journal 2007 Enhanced Performance of Si Nanocrystal LEDs by Using Ni∕Ag/Indium Tin Oxide Contact   Huh Chul  Electrochemical and Solid-State Letters, v.10, no.1, pp.J9-J11 0 원문
특허 검색결과
Status Year Patent Name Country Family Pat. KIPRIS
Registered 2017 입자 빔의 깊이 프로파일 측정방법 KOREA KIPRIS
연구보고서 검색결과
Type Year Research Project Primary Investigator Download
No search results.