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Journal
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2019 |
Origin of the Dry Etch Damage in the Short-channel Oxide Thin-film Transistors for High Resolution Display Application
Ji Hun Choi Thin Solid Films, v.674, pp.71-75 |
7 |
원문
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Journal
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2017 |
Analysis of Electrical Characteristics of AlGaN/GaN on Si Large SBD by Changing Structure
Lee Hyun Soo Journal of Semiconductor Technology and Science, v.17, no.3, pp.354-362 |
1 |
원문
|
|
Journal
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2015 |
0.34 VT AlGaN/GaN-on-Si Large Schottky Barrier Diode With Recessed Dual Anode Metal
Lee Hyun Soo IEEE Electron Device Letters, v.36, no.11, pp.1132-1134 |
53 |
원문
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|
Journal
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2003 |
Attenuation characteristics of InP/InGaAsP deep‐ridge waveguide turning mirror
Jeong Woo Park Microwave and Optical Technology Letters, v.37, no.6, pp.428-431 |
1 |
원문
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