Subjects :
Stress measurement
논문 검색결과
| Type |
Year |
Title |
Cited |
Download |
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Journal
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2023 |
Mechanisms of the Device Property Alteration Generated by the Proton Irradiation in GaN-Based MIS-HEMTs Using Extremely Thin Gate Insulator
Sungjae Chang Nanomaterials, v.13, no.5, pp.1-13 |
2 |
원문
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Journal
|
2021 |
Substrate Effects on the Electrical Properties in GaN-Based High Electron Mobility Transistors
Sungjae Chang Crystals, v.11, no.11, pp.1-10 |
9 |
원문
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|
Journal
|
2020 |
Comprehensive Research of Total Ionizing Dose Effects in GaN-Based MIS-HEMTs Using Extremely Thin Gate Dielectric Layer
Sungjae Chang Nanomaterials, v.10, no.11, pp.1-11 |
14 |
원문
|
|
Conference
|
2016 |
A Novel Stress Measurement System with Handhold Electrodes in Massage Chairs
Jeongkyun Kim International Conference on Information and Communication Technology Convergence (ICTC) 2016, pp.859-863 |
3 |
원문
|
|
Journal
|
2007 |
Stress Reduction of Ge2Sb2Te5 Crystallization by Capping Al2O3 Film Grown by PEALD
Park Young Sam ECS Transactions, v.11, no.7, pp.245-248 |
3 |
원문
|
|
Journal
|
2003 |
Measurement method for profiling the residual stress of an optical fiber: detailed analysis of off-focusing and beam-deflection effects
Park Yongwoo Applied Optics, v.42, no.7, pp.1182-1190 |
17 |
원문
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특허 검색결과
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연구보고서 검색결과
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