Subjects :
device degradation
논문 검색결과
| Type |
Year |
Title |
Cited |
Download |
|
Conference
|
2022 |
Mechanisms of Device Degradation Induced by Proton Irradiation in the GaN-based MIS-HEMTs
Sungjae Chang International Conference on Accelerators and Beam Utilizations (ICABU) 2022, pp.45-45 |
|
|
|
Journal
|
2017 |
High Temperature Storage Test and Its Effect on the Thermal Stability and Electrical Characteristics of AlGaN/GaN High Electron Mobility Transistors
Jongmin Lee Current Applied Physics, v.17, no.2, pp.157-161 |
16 |
원문
|
|
Journal
|
2015 |
Photovoltaic Performance and Interface Behaviors of Cu(In,Ga)Se2 Solar Cells with a Sputtered-Zn(O,S) Buffer Layer by High-Temperature Annealing
Wi Jae-Hyung ACS Applied Materials & Interfaces, v.7, no.31, pp.17425-17432 |
47 |
원문
|
|
Journal
|
2014 |
Analysis of the Degradation of AlGaN/GaN HEMTs by High-temperature Operation Tests
Jongmin Lee Journal of the Korean Physical Society, v.64, no.10, pp.1446-1450 |
3 |
원문
|
|
Journal
|
2009 |
Comparative Study of Electrical Instabilities in Top-Gate InGaZnO thin Film Transistors with Al2O3 and Al2O3/SiNx Gate Dielectrics
이정민 Applied Physics Letters, v.94, no.22, pp.1-4 |
111 |
원문
|
특허 검색결과
| Status |
Year |
Patent Name |
Country |
Family Pat. |
KIPRIS |
|
No search results. |
연구보고서 검색결과
| Type |
Year |
Research Project |
Primary Investigator |
Download |
|
No search results. |