Subjects :
C-V characteristics
논문 검색결과
| Type |
Year |
Title |
Cited |
Download |
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Journal
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2013 |
Capacitance–voltage characterization of surface-treated Al2O3/GaN metal–oxide–semiconductor structures
Bae Sung-Bum Microelectronic Engineering, v.109, pp.10-12 |
6 |
원문
|
|
Journal
|
2010 |
Effects of N2 and NH3 Remote Plasma Nitridation on the Structural and Electrical Characteristics of the HfO2 Gate Dielectrics
Park Kun Sik Applied Surface Science, v.257, no.4, pp.1347-1350 |
37 |
원문
|
|
Journal
|
2010 |
Temperature Dependency and Carrier Transport Mechanisms of Ti/p-Type InP Schottky Rectifiers
V. Janardhanam Journal of Alloys and Compounds, v.504, no.1, pp.146-150 |
88 |
원문
|
|
Journal
|
2008 |
Properties of Ferroelectric P(VDF-TrFE) 70/30 Copolymer Films as a Gate Dielectric
Jung Soonwon Integrated Ferroelectrics, v.100, no.1, pp.198-205 |
24 |
원문
|
특허 검색결과
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연구보고서 검색결과
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